Energy storage net news: China national standards institute (NIST) recently released the news said that the researchers used two kinds of new techniques, nanoscale precision detection for the first time with the widespread use of the chemical composition of solar cells and the change of the defect.
New technology to detect the made of cadmium telluride semiconductor materials common solar cell, could help scientists better understand the microcosmic structure of solar cells, and may further improve the photoelectric conversion efficiency of solar energy method is put forward.
In this study, the NIST scientists used two based on atomic force microscope (AFM) auxiliary method, through light induced resonance (PTIR) to measure the solar cell sample absorbed from the wide wavelength range in the visible and infrared light, thus in nano scale composition of solar cells and its defects.
Another technique, known as the scanning near-field optical microscope (NSOM) dt, by recording a specific location transmission light to capture the number of solar cells composition and the change of the defect, thus forming nanometer scale images in detail.
The experiments show that the defects in the crystal arrangement of materials are related to impurities in the chemical composition, and the new technology can detect the spatial variation of the so-called deep defects in cadmium telluride samples.
These defects caused in cadmium telluride and other semiconductor electrons and protons (positively charged particles) back together, rather than power, this is one of the key reasons of theoretical results were obtained in the solar cell can't.
The results are widely applicable and will help solar cell research to better understand various photovoltaic materials.
The findings were published in the April 12, 2017 issue of Nanoscale.